9887cd8adc
Reviewed-by: mdoerr
457 lines
20 KiB
Java
457 lines
20 KiB
Java
/*
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* Copyright (c) 2012, 2021, Oracle and/or its affiliates. All rights reserved.
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* DO NOT ALTER OR REMOVE COPYRIGHT NOTICES OR THIS FILE HEADER.
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*
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* This code is free software; you can redistribute it and/or modify it
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* under the terms of the GNU General Public License version 2 only, as
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* published by the Free Software Foundation.
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*
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* This code is distributed in the hope that it will be useful, but WITHOUT
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* ANY WARRANTY; without even the implied warranty of MERCHANTABILITY or
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* FITNESS FOR A PARTICULAR PURPOSE. See the GNU General Public License
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* version 2 for more details (a copy is included in the LICENSE file that
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* accompanied this code).
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*
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* You should have received a copy of the GNU General Public License version
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* 2 along with this work; if not, write to the Free Software Foundation,
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* Inc., 51 Franklin St, Fifth Floor, Boston, MA 02110-1301 USA.
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*
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* Please contact Oracle, 500 Oracle Parkway, Redwood Shores, CA 94065 USA
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* or visit www.oracle.com if you need additional information or have any
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* questions.
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*/
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import java.util.ArrayList;
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import java.util.List;
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import java.util.PrimitiveIterator;
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import java.util.random.*;
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import java.util.Set;
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import java.util.concurrent.CompletableFuture;
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import java.util.concurrent.ExecutionException;
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import java.util.concurrent.ThreadLocalRandom;
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import java.util.concurrent.TimeUnit;
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import java.util.concurrent.TimeoutException;
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import java.util.function.IntSupplier;
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import java.util.function.LongSupplier;
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import java.util.function.BooleanSupplier;
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import java.util.function.Supplier;
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import java.util.stream.Stream;
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import static java.util.stream.Collectors.toList;
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import static java.util.stream.Collectors.toSet;
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/**
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* @test
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* @summary test bit sequences produced by classes that implement interface RandomGenerator
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* @bug 8248862
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* @run main/othervm/timeout=400 RandomTestBsi1999
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* @key randomness
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*/
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public class RandomTestBsi1999 {
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/* A set of tests for pseudorandom number generators inspired by this report:
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*
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* Werner Schindler. Functionality Classes and Evaluation Methodology for
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* Deterministic Random Number Generators, Version 2.0.
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* Bundesamt fur Sicherheit in der Informationstechnik (BSI). December 2, 1999.
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* https://www.bsi.bund.de/SharedDocs/Downloads/DE/BSI/Zertifizierung/Interpretationen/AIS_20_Functionality_Classes_Evaluation_Methodology_DRNG_e.pdf
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*
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* Section F of this report (pp. 19-20) recommends the use of five tests to evaluate a
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* sequence of bits:
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*
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* Monobit test
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* Poker test
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* Run test
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* Long run test
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* Autocorrelation test
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*
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* The first four of these tests are in turn taken from this report:
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*
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* National Institute of Standards and Technology (NIST),
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* U.S. Department of Commerce. Security Requirements for
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* Cryptographic Modules. Federal Information Processing
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* Standard (FIPS) 140-1, January 11, 1994.
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* https://csrc.nist.gov/csrc/media/publications/fips/140/1/archive/1994-01-11/documents/fips1401.pdf
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*
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* The BSI report appears to contain a few typos in transcribing the FIPS 140-1
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* requirements (pp. 44-45); specifically, the last three intervals for the runs test
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* (for lengths 4, 5, and 6+) are given as "223 - 402, 90 - 223, 90 - 223" in the FIPS
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* standard but as "233-402, 90-223, 90-233" in the BSI publication. A quick
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* mathematical check indicates that the FIPS 140-1 values are correct; therefore we
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* use those values here. In addition, the BSI report specifies a test interval of
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* 2326-2674 for the autocorrelation test, which provides an appropriately small
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* rejection rate if the test were done for only a single value of tau; but because we
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* wish to perform 5000 distinct tests, one for each value of tau in the range 1-5000,
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* that test interval produces too many false positives. Some calculation shows that
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* the interval 2267-2733 used by the FIPS 140-1 run test for runs of length 1 is
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* appropriate, so we use that interval here for each of the 5000 individual
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* autocorrelation tests.
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*
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* Each of the four FIPS 140-1 tests examines a sequence of 20000 bits. The
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* autocorrelation test examines a sequence of 10000 bits. It is convenient to
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* generate a sequence of 20000 bits (which we represent as an array of 20000 bytes)
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* and then apply all five tests, knowing that the autocorrelation test will examine
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* only the first half of the byte array.
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*
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* The descriptions of the tests are quoted from the FIPS 140-1 and BSI reports
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* (with some adjustments of punctuation and mathematical symbols, as well as
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* for our specific choices of test intervals).
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*/
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static String currentRNG = "";
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static int failCount = 0;
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static void exceptionOnFail() {
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if (failCount != 0) {
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throw new RuntimeException(failCount + " fails detected");
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}
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}
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static void setRNG(String rng) {
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currentRNG = rng;
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}
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static void fail(String format, Object... args) {
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if (currentRNG.length() != 0) {
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System.err.println(currentRNG);
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currentRNG = "";
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}
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System.err.format(" " + format, args);
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failCount++;
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}
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private static final int SEQUENCE_SIZE = 20000;
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/* The Monobit Test
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*
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* 1. Count the number of ones in the 20,000 bit stream. Denote this quantity by X.
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*
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* 2. The test is passed if 9,654 < X < 10,346.
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*/
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static int monobitTest(String id, byte[] s) {
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// System.out.println("monobit test");
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int count = 0;
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for (int j = 0; j < s.length; j++) {
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count += s[j];
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}
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int monobitFailure = ((9654 < count) && (count < 10346)) ? 0 : 1;
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if (monobitFailure != 0) fail("monobit test failure for %s: count=%d (should be in [9654,10346])\n", id, count);
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return monobitFailure;
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}
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/* The Poker Test
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*
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* 1. Divide the 20,000 bit stream into 5,000 contiguous 4-bit segments. Count and
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* store the number of occurrences of each of the 16 possible 4-bit values. Denote
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* f(i) as the number of each 4-bit value i where 0 <= i <= 15.
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*
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* 2. Evaluate the following: X = (16/5000)(sum[i=0,15] (f(i))**2) - 5000
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*
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* 3. The test is passed if 1.03 < X < 57.4.
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*/
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static int pokerTest(String id, byte[] s) {
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// System.out.println("poker test");
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// Divide the bit sequence into 4-bit chunks, and count the number of times each 4-bit value appears.
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int[] stats = new int[16];
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int v = 0;
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for (int j = 0; j < s.length; j++) {
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v = (v << 1) | s[j];
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if ((j & 3) == 3) {
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++stats[v];
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v = 0;
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}
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}
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int z = 0;
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for (int k = 0; k < stats.length; k++) {
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z += stats[k]*stats[k];
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}
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double x = (16.0 / (s.length / 4)) * z - (s.length / 4);
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int pokerFailure = ((1.03 < x) && (x < 57.4)) ? 0 : 1;
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if (pokerFailure != 0) fail("poker test failure for %s: x=%g (should be in [1.03,57.4])\n", id, x);
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return pokerFailure;
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}
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/* The Runs Test
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*
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* 1. A run is defined as a maximal sequence of consecutive bits of either all ones
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* or all zeros, which is part of the 20,000 bit sample stream. The incidences of
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* runs (for both consecutive zeros and consecutive ones) of all lengths (>= 1) in
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* the sample stream should be counted and stored.
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*
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* 2. The test is passed if the number of runs that occur (of lengths 1 through 6)
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* is each within the corresponding interval specified below. This must hold for
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* both the zeros and ones; that is, all 12 counts must lie in the specified
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* interval. For the purpose of this test, runs of greater than 6 are considered to
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* be of length 6.
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*
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* Length of run Required Interval
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* 1 2,267 - 2,733
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* 2 1,079 - 1,421
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* 3 502 - 748
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* 4 223 - 402
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* 5 90 - 223
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* 6+ 90 - 223
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*
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* The Long Run Test
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*
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* 1 . A long run is defined to be a run of length 34 or more (of either zeros or ones).
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*
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* 2. On the sample of 20,000 bits, the test is passed if there are NO long runs.
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*/
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static int runTestAndLongRunTest(String id, byte[] s) {
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// System.out.println("run test");
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int[][] stats = new int[2][8];
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int count = 0;
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for (int j = 0; j < s.length; j++) {
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++count;
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if ((j == (s.length - 1)) || (s[j+1] != s[j])) {
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++stats[s[j]][(count < 6) ? count : (count < 34) ? 6 : 7];
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count = 0;
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}
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}
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stats[0][6] += stats[0][7];
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stats[1][6] += stats[1][7];
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int runFailure = checkRunStats(stats[0]) | checkRunStats(stats[1]);
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if (runFailure != 0) fail("run test failure for %s\n", id);
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int longRunFailure = ((stats[0][7] == 0) && (stats[1][7] == 0)) ? 0 : 1;
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if (longRunFailure != 0) fail("long run test failure for %s\n", id);
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return (runFailure + longRunFailure);
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}
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static int checkRunStats(int[] stats) {
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int runFailure = 0;
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runFailure |= ((2267 <= stats[1]) && (stats[1] <= 2733)) ? 0 : 1;
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runFailure |= ((1079 <= stats[2]) && (stats[2] <= 1421)) ? 0 : 1;
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runFailure |= (( 502 <= stats[3]) && (stats[3] <= 748)) ? 0 : 1;
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runFailure |= (( 223 <= stats[4]) && (stats[4] <= 402)) ? 0 : 1;
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runFailure |= (( 90 <= stats[5]) && (stats[5] <= 223)) ? 0 : 1;
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runFailure |= (( 90 <= stats[6]) && (stats[6] <= 223)) ? 0 : 1;
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return runFailure;
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}
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/* Autocorrelation Test
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*
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* For tau in {1, ..., 5000}, Z[tau] := sum[j=1,5000] (b[j] ^ b[j+tau]).
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*
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* The sequence passes the autocorrelation test if every Z[tau] lies within the
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* interval 2267-2733.
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*/
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static int autocorrelationTest(String id, byte[] s) {
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// System.out.println("autocorrelation test");
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int autocorrelationFailure = 0;
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int N = s.length / 4;
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for (int tau = 1; tau <= N; tau++) {
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int count = 0;
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for (int j = 0; j < N; j++) {
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count += (s[j] ^ s[j+tau]);
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}
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// We intentionally use bounds [2267, 2733], which are wider than
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// the bounds [2326, 2674] specified by BSI for this test.
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// The latter bounds produce way too many false positives.
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int singleAutocorrelationFailure = ((2267 < count) && (count < 2733)) ? 0 : 1;
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if (singleAutocorrelationFailure != 0) {
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if (autocorrelationFailure < 8) {
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fail("autocorrelation failure for %s: count=%d (should be in [2267,2733]), tau=%d\n", id, count, tau);
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if (count < 100 || count > 4900) {
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System.out.print(" ");
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for (int q = 0; q < 50; q++) System.out.print(s[q]);
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System.out.println();
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}
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}
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}
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autocorrelationFailure += singleAutocorrelationFailure;
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}
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return (autocorrelationFailure == 0) ? 0 : 1;
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}
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static int entireBsi1999Test(String id, byte[] s) {
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return (monobitTest(id, s) +
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pokerTest(id, s) +
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runTestAndLongRunTest(id, s) +
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autocorrelationTest(id, s)
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);
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}
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/* To test a sequence of boolean values from a BooleanSupplier,
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* sequentially extract 20000 boolean values, convert to an array
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* of bytes, and feed them to method {@code entireBsi1999Test}.
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*/
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static int testRngBsi1999BooleanOnce(String id, BooleanSupplier theSupplier) {
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int failureCount = 0;
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byte[] s = new byte[SEQUENCE_SIZE];
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// Take the next SEQUENCE_SIZE booleans and test them
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for (int j = 0; j < s.length; j++) {
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s[j] = (theSupplier.getAsBoolean() ? (byte)1 : (byte)0);
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}
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failureCount += entireBsi1999Test(id + " consecutive", s);
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return failureCount;
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}
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/* To test a sequence of long values from a LongSupplier,
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* two kinds of tests are performed.
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*
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* The first kind of test extracts 313=ceiling(20000/64) long
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* values and concatenates all their bits; the first 20000 bits
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* are converted to a byte array of bits to be tested. This test is
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* repeated 64 times.
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*
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* The second kind of test focuses on one bit position m (0 <= m < 64);
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* it extracts 20000 long values and uses just bit m from each value
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* to produce an array of bytes to be tested. This test is performed
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* once for each possible value of m (64 times in all).
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*/
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static int testRngBsi1999LongOnce(String id, LongSupplier theSupplier) {
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int failureCount = 0;
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byte[] s = new byte[SEQUENCE_SIZE];
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// Part 1: 64 times, take the next SEQUENCE_SIZE bits and test them
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for (int m = 0; m < 64; m++) {
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long bits = 0;
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int bitCount = 0;
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for (int j = 0; j < s.length; j++) {
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if ((j & 0x3f) == 0) {
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bits = theSupplier.getAsLong();
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// System.out.printf("0x%016x\n", bits);
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bitCount += Long.bitCount((j == (20000 - 32)) ? ((bits << 32) >>> 32) : bits);
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}
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s[j] = (byte)(bits & 1);
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bits >>>= 1;
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}
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// System.out.println(m + ": " + bitCount + " 1-bits");
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failureCount += entireBsi1999Test(id + " consecutive (" + bitCount + " 1-bits)", s);
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}
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// Part 2: for 0 <= m < 64, use bit m from each of the next SEQUENCE_SIZE longs
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for (int m = 0; m < 64; m++) {
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for (int j = 0; j < s.length; j++) {
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s[j] = (byte)((theSupplier.getAsLong() >>> m) & 1);
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}
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failureCount += entireBsi1999Test(id + " bit " + m, s);
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}
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return failureCount;
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}
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/* To test a sequence of ing values from an IntSupplier,
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* two kinds of tests are performed.
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*
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* The first kind of test extracts 625=20000/32 int values and
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* concatenates all their bits; these 20000 bits are converted to
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* a byte array of bits to be tested. This test is repeated 64
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* times.
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*
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* The second kind of test focuses on one bit position m (0 <= m < 32);
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* it extracts 20000 int values and uses just bit m from each value
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* to produce an array of bytes to be tested. This test is performed
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* once for each possible value of m (32 times in all).
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*/
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static int testRngBsi1999IntOnce(String id, IntSupplier theSupplier) {
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int failureCount = 0;
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byte[] s = new byte[SEQUENCE_SIZE];
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// Part 1: 64 times, take the next SEQUENCE_SIZE bits and test them
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for (int m = 0; m < 64; m++) {
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int bits = 0;
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int bitCount = 0;
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for (int j = 0; j < s.length; j++) {
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if ((j & 0x1f) == 0) {
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bits = theSupplier.getAsInt();
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bitCount += Integer.bitCount(bits);
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}
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s[j] = (byte)(bits & 1);
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bits >>>= 1;
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}
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// System.out.println(m + ": " + bitCount + " 1-bits");
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failureCount += entireBsi1999Test(id + " consecutive (" + bitCount + " 1-bits)", s);
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}
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// Part 2: for 0 <= m < 32, use bit m from each of the next SEQUENCE_SIZE ints
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for (int m = 0; m < 32; m++) {
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for (int j = 0; j < s.length; j++) {
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s[j] = (byte)((theSupplier.getAsInt() >>> m) & 1);
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}
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failureCount += entireBsi1999Test(id + " bit " + m, s);
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}
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return failureCount;
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}
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/* A call to {@code entireBsi1999Test} may report failure even if the source of random
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* bits is quite good, because the test is statistical in nature. To make the testing
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* procedure more robust, if the first call to {@code entireBsi1999Test} fails, then
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* the failure is ignored if two more calls to {@code entireBsi1999Test} both succeed.
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*/
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static boolean testRngBsi1999Boolean(String id, BooleanSupplier theSupplier, int failureTolerance) {
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if (testRngBsi1999BooleanOnce(id, theSupplier) <= failureTolerance) return true;
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fail("testRngBsi1999Boolean glitch");
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return ((testRngBsi1999BooleanOnce(id, theSupplier) <= failureTolerance) &&
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(testRngBsi1999BooleanOnce(id, theSupplier) <= failureTolerance));
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}
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static boolean testRngBsi1999Long(String id, LongSupplier theSupplier, int failureTolerance) {
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if (testRngBsi1999LongOnce(id, theSupplier) <= failureTolerance) return true;
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fail("testRngBsi1999Long glitch");
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return ((testRngBsi1999LongOnce(id, theSupplier) <= failureTolerance) &&
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(testRngBsi1999LongOnce(id, theSupplier) <= failureTolerance));
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}
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static boolean testRngBsi1999Int(String id, IntSupplier theSupplier, int failureTolerance) {
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if (testRngBsi1999IntOnce(id, theSupplier) <= failureTolerance) return true;
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fail("testRngBsi1999Int glitch");
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return ((testRngBsi1999IntOnce(id, theSupplier) <= failureTolerance) &&
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(testRngBsi1999IntOnce(id, theSupplier) <= failureTolerance));
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}
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static void tryIt(RandomGenerator rng, String id, BooleanSupplier theSupplier) {
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System.out.printf("Testing %s %s\n", rng.getClass().getName(), id);
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boolean success = theSupplier.getAsBoolean();
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if (!success) {
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fail("*** Failure of %s %s\n", rng.getClass().getName(), id);
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}
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}
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static void testOneRng(RandomGenerator rng, int failureTolerance) {
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String name = rng.getClass().getName();
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tryIt(rng, "nextInt", () -> testRngBsi1999Int(name + " nextInt", rng::nextInt, failureTolerance));
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tryIt(rng, "nextLong", () -> testRngBsi1999Long(name + " nextLong", rng::nextLong, failureTolerance));
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tryIt(rng, "nextBoolean", () -> testRngBsi1999Boolean(name + " nextBoolean", rng::nextBoolean, failureTolerance));
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tryIt(rng, "ints", () -> testRngBsi1999Int(name + " ints", rng.ints().iterator()::next, failureTolerance));
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tryIt(rng, "longs", () -> testRngBsi1999Long(name + " longs", rng.longs().iterator()::next, failureTolerance));
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{
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PrimitiveIterator.OfDouble iter = rng.doubles().iterator();
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tryIt(rng, "doubles",
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() -> testRngBsi1999Int(name + " doubles",
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() -> (int)(long)Math.floor(iter.next() * 0x1.0p32),
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failureTolerance));
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}
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tryIt(rng, "nextDouble",
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() -> testRngBsi1999Int(name + " nextDouble",
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|
() -> (int)(long)Math.floor(rng.nextDouble() * 0x1.0p32),
|
|
failureTolerance));
|
|
tryIt(rng, "nextFloat",
|
|
() -> testRngBsi1999Int(name + " nextFloat",
|
|
() -> (((int)(long)Math.floor(rng.nextFloat() * 0x1.0p16f) << 16)
|
|
| (int)(long)Math.floor(rng.nextFloat() * 0x1.0p16f)),
|
|
failureTolerance));
|
|
}
|
|
|
|
public static void main(String[] args) {
|
|
RandomGeneratorFactory.all().forEach(factory -> {
|
|
setRNG(factory.name());
|
|
|
|
if (currentRNG.equals("SecureRandom")) {
|
|
// skip because stochastic
|
|
} else if (currentRNG.equals("Random")) {
|
|
// testOneRng(factory.create(59), 1);
|
|
// autocorrelation failure for java.util.Random longs bit 0: count=2207 (should be in [2267,2733]), tau=2819
|
|
|
|
} else {
|
|
testOneRng(factory.create(59), 0);
|
|
}
|
|
});
|
|
|
|
exceptionOnFail();
|
|
}
|
|
}
|
|
|