66c00b4184
Develop tests covering all the test cases described in the test plan and achieve 100% pass rate for JEP 316: Heap Allocation on Alternative Memory Devices Reviewed-by: sangheki, tschatzl |
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.. | ||
applications | ||
compiler | ||
gc | ||
gtest | ||
native_sanity | ||
runtime | ||
sanity | ||
serviceability | ||
testlibrary | ||
testlibrary_tests | ||
jprt.config | ||
Makefile | ||
ProblemList.txt | ||
test_env.sh | ||
TEST.groups | ||
TEST.ROOT |